JPH0163063U - - Google Patents

Info

Publication number
JPH0163063U
JPH0163063U JP1987157429U JP15742987U JPH0163063U JP H0163063 U JPH0163063 U JP H0163063U JP 1987157429 U JP1987157429 U JP 1987157429U JP 15742987 U JP15742987 U JP 15742987U JP H0163063 U JPH0163063 U JP H0163063U
Authority
JP
Japan
Prior art keywords
electron microscope
scanning electron
storage device
charging
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1987157429U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987157429U priority Critical patent/JPH0163063U/ja
Publication of JPH0163063U publication Critical patent/JPH0163063U/ja
Pending legal-status Critical Current

Links

JP1987157429U 1987-10-16 1987-10-16 Pending JPH0163063U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987157429U JPH0163063U (en]) 1987-10-16 1987-10-16

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987157429U JPH0163063U (en]) 1987-10-16 1987-10-16

Publications (1)

Publication Number Publication Date
JPH0163063U true JPH0163063U (en]) 1989-04-24

Family

ID=31436863

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987157429U Pending JPH0163063U (en]) 1987-10-16 1987-10-16

Country Status (1)

Country Link
JP (1) JPH0163063U (en])

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005191017A (ja) * 2005-03-25 2005-07-14 Hitachi Ltd 走査型電子顕微鏡
JP2015056330A (ja) * 2013-09-13 2015-03-23 株式会社日立ハイテクノロジーズ 荷電粒子線装置
WO2023139668A1 (ja) * 2022-01-19 2023-07-27 株式会社日立ハイテク 荷電粒子線装置及びそれを用いた検査方法

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005191017A (ja) * 2005-03-25 2005-07-14 Hitachi Ltd 走査型電子顕微鏡
JP2015056330A (ja) * 2013-09-13 2015-03-23 株式会社日立ハイテクノロジーズ 荷電粒子線装置
WO2023139668A1 (ja) * 2022-01-19 2023-07-27 株式会社日立ハイテク 荷電粒子線装置及びそれを用いた検査方法
JPWO2023139668A1 (en]) * 2022-01-19 2023-07-27

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