JPH0163063U - - Google Patents
Info
- Publication number
- JPH0163063U JPH0163063U JP1987157429U JP15742987U JPH0163063U JP H0163063 U JPH0163063 U JP H0163063U JP 1987157429 U JP1987157429 U JP 1987157429U JP 15742987 U JP15742987 U JP 15742987U JP H0163063 U JPH0163063 U JP H0163063U
- Authority
- JP
- Japan
- Prior art keywords
- electron microscope
- scanning electron
- storage device
- charging
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 1
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987157429U JPH0163063U (en]) | 1987-10-16 | 1987-10-16 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987157429U JPH0163063U (en]) | 1987-10-16 | 1987-10-16 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0163063U true JPH0163063U (en]) | 1989-04-24 |
Family
ID=31436863
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1987157429U Pending JPH0163063U (en]) | 1987-10-16 | 1987-10-16 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0163063U (en]) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005191017A (ja) * | 2005-03-25 | 2005-07-14 | Hitachi Ltd | 走査型電子顕微鏡 |
JP2015056330A (ja) * | 2013-09-13 | 2015-03-23 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置 |
WO2023139668A1 (ja) * | 2022-01-19 | 2023-07-27 | 株式会社日立ハイテク | 荷電粒子線装置及びそれを用いた検査方法 |
-
1987
- 1987-10-16 JP JP1987157429U patent/JPH0163063U/ja active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005191017A (ja) * | 2005-03-25 | 2005-07-14 | Hitachi Ltd | 走査型電子顕微鏡 |
JP2015056330A (ja) * | 2013-09-13 | 2015-03-23 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置 |
WO2023139668A1 (ja) * | 2022-01-19 | 2023-07-27 | 株式会社日立ハイテク | 荷電粒子線装置及びそれを用いた検査方法 |
JPWO2023139668A1 (en]) * | 2022-01-19 | 2023-07-27 |